Structured Summary
Abstract
Scanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
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Synonyms
1 entry terms
- Microscopy, Scanning Probe
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Aspects Covered
10 allowable subheadings
Indexed with the subheadings classification, economics, ethics, history, instrumentation, methods, standards, statistics & numerical data, trends, veterinary.
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History Note
2000; use MICROSCOPY, ATOMIC FORCE 1999
MeSH Record
Previous Indexing
- Microscopy, Atomic Force (1999)
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AMA Style
References
- National Library of Medicine. Scanning Probe Microscopy. Medical Subject Headings (MeSH). 2026. Unique ID D020527. http://id.nlm.nih.gov/mesh/2026/D020527
- Scanning Probe Microscopy. In: Wikipedia. https://en.wikipedia.org/wiki/Scanning_probe_microscopy
- Scanning Probe Microscopy. In: Wikidata. https://www.wikidata.org/wiki/Q907287